ADVANCES IN MEASUREMENT TECHNIQUES FOR CHARACTERIZING MID-IR FIBERS IN THE 2-12 mu M WAVELENGTH REGION.

Authors

Harish R.D. Sunak, University of Rhode Island
Steven P. Bastien, University of Rhode Island

Document Type

Conference Proceeding

Date of Original Version

1-1-1988

Abstract

Recent advances that have taken place in laser sources and detectors for use with mid-IR fibers in the 2-12- mu m wavelength region are discussed. Emphasis is placed on III-V semiconductor devices. The parameters highlighted are temperature of operation, threshold current density, output power (for lasers), quantum efficiency, modulation response, and dark current (for detectors). It is seen that much work remains to be done so that these devices can eventually be used in practical systems.

Citation/Publisher Attribution

Sunak, Harish R., and Steven P. Bastien. "ADVANCES IN MEASUREMENT TECHNIQUES FOR CHARACTERIZING MID-IR FIBERS IN THE 2-12 mu M WAVELENGTH REGION.." (1988): 358-362. https://digitalcommons.uri.edu/ele_facpubs/1024