Unified approach for digital VLSI test generation

Author

Peilin Song, University of Rhode Island

Date of Award

1997

Degree Type

Dissertation

Degree Name

Doctor of Philosophy in Electrical Engineering

First Advisor

Jien-Chung Lo

Comments

This dissertation was scanned from microfilm. To report any image quality issues, please contact the URI library at digitalcommons-group@uri.edu as we may be able to fix the problem. The copyright in this dissertation belongs to the author.

Recommended Citation

Song, Peilin, "Unified approach for digital VLSI test generation" (1997). Open Access Dissertations. Paper 4187.
https://digitalcommons.uri.edu/oa_diss/4187