Date of Award
2005
Degree Type
Dissertation
Degree Name
Doctor of Philosophy in Physics
First Advisor
David Heskett
Abstract
Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnects. A common method to monitor interconnect degradation is through electrical resistance measurements, which requires direct electrical contacts. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only provides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.
Recommended Citation
Li, Linghong, "Using the optical microscopy imaging method for studying electromigration" (2005). Open Access Dissertations. Paper 2021.
https://digitalcommons.uri.edu/oa_diss/2021
Terms of Use
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Comments
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