Title

Reliability: Fallacy or reality?

Document Type

Article

Date of Original Version

11-1-2007

Abstract

As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it. © 2007 IEEE.

Publication Title

IEEE Micro

Volume

27

Issue

6

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