Title
Reliability: Fallacy or reality?
Document Type
Article
Date of Original Version
11-1-2007
Abstract
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it. © 2007 IEEE.
Publication Title, e.g., Journal
IEEE Micro
Volume
27
Issue
6
Citation/Publisher Attribution
González, Antonio, Scott Mahlke, Shubu Mukherjee, Resit Sendag, Derek Chiou, and Joshua J. Yi. "Reliability: Fallacy or reality?." IEEE Micro 27, 6 (2007): 36-45. doi: 10.1109/MM.2007.107.
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