An SFS Berger Check Prediction ALU and Its Application to Self-Checking Processor Designs

Authors

Jien Chung Lo, University of Rhode Island
Suchai Thanawastien, Rangsit University
T. R.N. Rao, University of Louisiana at Lafayette
Michael Nicolaidis, Institut polytechnique de Grenoble

Document Type

Article

Date of Original Version

1-1-1992

Abstract

A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is presented in this paper. The fault and error models of a large class of VLSI ALU designs are discussed. The proposed design is proved to be fault-secure and self-testing with respect to any single fault in the ALU part. Then, the proposed BCP ALU is proved to be SFS with any design of BCP circuit. Consequently, a self-checking processor whose data path is encoded entirely in a Berger code can be achieved. An efficient self-checking processor can then be designed. © 1992 IEEE

Publication Title, e.g., Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volume

11

Issue

4

Citation/Publisher Attribution

Lo, Jien Chung, Suchai Thanawastien, T. R. Rao, and Michael Nicolaidis. "An SFS Berger Check Prediction ALU and Its Application to Self-Checking Processor Designs." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 11, 4 (1992): 525-540. doi: 10.1109/43.125100.