Equivalent IDDQ tests for systems with regulated power supply
Document Type
Conference Proceeding
Date of Original Version
12-1-2006
Abstract
This paper presents an equivalent current sensing technique for the applications of IDDQ tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQ information. Equivalent IDDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQ based test methods are used to post-process those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18μm CMOS technology. © 2006 IEEE.
Publication Title, e.g., Journal
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Citation/Publisher Attribution
Chen, Chuen Song, Jien Chung Lo, and Tian Xia. "Equivalent IDDQ tests for systems with regulated power supply." Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (2006): 291-299. doi: 10.1109/DFT.2006.28.
