Device technology limitations in monolithic switched-capacitor Σ-Δ modulators

Document Type

Article

Date of Original Version

1-1-2002

Abstract

This paper analyzes non-ideal effects and fundamental limitations encountered in Σ-Δ analog-to-digital converters realized by switched-capacitor techniques. Expressions are derived for the lower noise bound as a function of the modulator network structure. Circuit imperfections and device limitations are simulated using a behavioral model. The theoretical results are compared to simulations and actual measurements performed with monolithic implementations of the MASH and the iflf5 network structures. The circuits are implemented in a 2.0 and a 1.2 μm double-poly CMOS process, respectively. © 2002 Published by Elsevier Science Ltd.

Publication Title, e.g., Journal

Measurement: Journal of the International Measurement Confederation

Volume

31

Issue

1

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