Dispersion of the resonant second order nonlinearity in 2D semiconductors probed by femtosecond continuum pulses

Document Type

Article

Date of Original Version

10-1-2017

Abstract

We demonstrate an effective microspectroscopy technique by tracing the dispersion of second order nonlinear susceptibility (χ(2)) in a monolayer tungsten diselenide (WSe2). The χ(2) dispersion obtained with better than 3 meV photon energy resolution showed peak value being within 6.3-8.4×10-19 m2/V range. We estimate the fundamental bandgap to be at 2.2 eV. Sub-structure in the χ(2) dispersion reveals a contribution to the nonlinearity due to exciton transitions with exciton binding energy estimated to be at 0.7 eV.

Publication Title, e.g., Journal

AIP Advances

Volume

7

Issue

10

Share

COinS