Dispersion of the resonant second order nonlinearity in 2D semiconductors probed by femtosecond continuum pulses
Document Type
Article
Date of Original Version
10-1-2017
Abstract
We demonstrate an effective microspectroscopy technique by tracing the dispersion of second order nonlinear susceptibility (χ(2)) in a monolayer tungsten diselenide (WSe2). The χ(2) dispersion obtained with better than 3 meV photon energy resolution showed peak value being within 6.3-8.4×10-19 m2/V range. We estimate the fundamental bandgap to be at 2.2 eV. Sub-structure in the χ(2) dispersion reveals a contribution to the nonlinearity due to exciton transitions with exciton binding energy estimated to be at 0.7 eV.
Publication Title, e.g., Journal
AIP Advances
Volume
7
Issue
10
Citation/Publisher Attribution
Mokim, Mohammad, Adam Card, Bindeshwar Sah, and Feruz Ganikhanov. "Dispersion of the resonant second order nonlinearity in 2D semiconductors probed by femtosecond continuum pulses." AIP Advances 7, 10 (2017). doi: 10.1063/1.5006794.