A new type of atomic force microscope based on chaotic motions
Document Type
Article
Date of Original Version
7-1-2008
Abstract
Local flow variation (LFV) method of non-linear time series analysis is applied to develop a chaotic motion-based atomic force microscope (AFM). The method is validated by analyzing time series from a simple numerical model of a tapping mode AFM. For both calibration and measurement procedures the simulated motions of the AFM are nominally chaotic. However, the distance between a tip of the AFM and a sample surface is still measured accurately. The LFV approach is independent of any particular model of the system and is expected to be applicable to other micro-electro-mechanical system sensors where chaotic motions are observed or can be introduced. © 2008 Elsevier Ltd. All rights reserved.
Publication Title, e.g., Journal
International Journal of Non-Linear Mechanics
Volume
43
Issue
6
Citation/Publisher Attribution
Liu, Ming, and David Chelidze. "A new type of atomic force microscope based on chaotic motions." International Journal of Non-Linear Mechanics 43, 6 (2008): 521-526. doi: 10.1016/j.ijnonlinmec.2008.03.001.