On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers
Document Type
Article
Date of Original Version
1-1-1990
Abstract
In the area of self-checking circuit designs, it is known that no combinational totally self-checking (TSC) checker has been designed for the 1-out-of-3 code. In this correspondence, we present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker that is TSC (satisfying the conventional TSC definition) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a suffficient level of safety for some implementations. © 1990 IEEE
Publication Title, e.g., Journal
IEEE Transactions on Computers
Volume
39
Issue
3
Citation/Publisher Attribution
Lo, Jien Chung, and Suchai Thanawastien. "On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers." IEEE Transactions on Computers 39, 3 (1990): 387-393. doi: 10.1109/12.48869.
