Title

A probabilistic measurement for totally self-checking circuits

Document Type

Conference Proceeding

Date of Original Version

1-1-1993

Abstract

In this paper we propose a probabilistic measurement for totally self-checking (TSC) circuits. This measurement is analogous to reliability of fault-tolerant systems and is defined as the Probability of Achieving TSC Goal (PATG). PATG surpasses the TSC definitions in determining the applicability of a circuit in an given application environment. For example, we show that an embedded TSC two-rail checker with two out of its four code word inputs unavailable gains a higher PATG than that in the ideal case. We also demonstrate the extension of PA TG concept to strongly fault-secure (SFS) circuits and strongly code disjoint (SCD) checkers. The PATG can be used in product specification, analogous to reliability, and can give precise behavioral description on fault/error handling performance of TSC circuits. This is a crucial step toward the practical applications of TSC or CED circuits.

Publication Title

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volume

1993-January

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