A probabilistic measurement for totally self-checking circuits
Date of Original Version
In this paper we propose a probabilistic measurement for totally self-checking (TSC) circuits. This measurement is analogous to reliability of fault-tolerant systems and is defined as the Probability of Achieving TSC Goal (PATG). PATG surpasses the TSC definitions in determining the applicability of a circuit in an given application environment. For example, we show that an embedded TSC two-rail checker with two out of its four code word inputs unavailable gains a higher PATG than that in the ideal case. We also demonstrate the extension of PA TG concept to strongly fault-secure (SFS) circuits and strongly code disjoint (SCD) checkers. The PATG can be used in product specification, analogous to reliability, and can give precise behavioral description on fault/error handling performance of TSC circuits. This is a crucial step toward the practical applications of TSC or CED circuits.
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Lo, Jien Chung, and Eiji Fujiwara. "A probabilistic measurement for totally self-checking circuits." Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 1993-January, (1993): 263-270. doi:10.1109/DFTVS.1993.595821.