Online current testing
Date of Original Version
Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications.
Publication Title, e.g., Journal
IEEE Design and Test of Computers
Lo, Jien Chung. "Online current testing." IEEE Design and Test of Computers 15, 4 (1998): 49-56. doi: 10.1109/54.735927.