Title

Online current testing

Document Type

Article

Date of Original Version

1-1-1998

Abstract

Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications.

Publication Title

IEEE Design and Test of Computers

Volume

15

Issue

4

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