Online current testing
Document Type
Article
Date of Original Version
1-1-1998
Abstract
Testing professionals must choose the online VLSI testing technique most suitable for mission goals with respect to design complexity, fault coverage, safety level, and product value. Online current testing techniques provide potential solutions to reliability problems in a wide spectrum of fault-tolerant applications.
Publication Title, e.g., Journal
IEEE Design and Test of Computers
Volume
15
Issue
4
Citation/Publisher Attribution
Lo, Jien Chung. "Online current testing." IEEE Design and Test of Computers 15, 4 (1998): 49-56. doi: 10.1109/54.735927.
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