Challenges of built-in current sensor designs
Document Type
Conference Proceeding
Date of Original Version
1-1-1998
Abstract
Built-in current sensors (BICSs) are very useful for both off-line and on-line testing. However, the practical use of BICS remains illusive due to several major concerns. This paper addresses the trade-off in design considerations and with examples from the existing designs. We then present a new BICS design which we believe can be easily incorporated into design automation process. Assuming that the CUT has been equipped with a voltage regulator, the proposed BICS obtains the IDDQ sample from the voltage regulator directly and non-destructively. The insertion of the proposed BICS can be easily automated due to its simplicity.
Publication Title, e.g., Journal
Proceedings - 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1998
Volume
1998-December
Citation/Publisher Attribution
Guo, Yu Yau, and Jien Chung Lo. "Challenges of built-in current sensor designs." Proceedings - 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1998 1998-December, (1998): 192-200. doi: 10.1109/DFTVS.1998.732166.