Effect of spot size on the determination of the diffusion length of minority carriers in p-n junctions using scanned light- or electron-beam techniques

Authors

Gabriel Lengyel, University of Rhode Island

Document Type

Article

Date of Original Version

1-1-1974

Publication Title, e.g., Journal

Solid State Electronics

Volume

17

Issue

5

Citation/Publisher Attribution

Lengyel, Gabriel. "Effect of spot size on the determination of the diffusion length of minority carriers in p-n junctions using scanned light- or electron-beam techniques." Solid State Electronics 17, 5 (1974): 510-512. doi: 10.1016/0038-1101(74)90085-9.