A Strongly Code Disjoint Built-In Current Sensor for Strongly Fault-Secure Static CMOS Realizations

Authors

Jien-Chung Lo, University of Rhode IslandFollow
James C. Daly, University of Rhode IslandFollow

Document Type

Article

Date of Original Version

1-1-1995

Publication Title, e.g., Journal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volume

14

Issue

11

Citation/Publisher Attribution

Lo, Jien-Chung, and James C. Daly. "A Strongly Code Disjoint Built-In Current Sensor for Strongly Fault-Secure Static CMOS Realizations." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 14, 11 (1995): 1402-1407. doi: 10.1109/43.469665.