Real-time in-chip phase noise characterization of digitally controlled swept laser source
Document Type
Conference Proceeding
Date of Original Version
1-1-2018
Abstract
Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.
Publication Title, e.g., Journal
Proceedings of SPIE - The International Society for Optical Engineering
Volume
10598
Citation/Publisher Attribution
Yao, Zheyi, Zhen Chen, Gerald Hefferman, and Tao Wei. "Real-time in-chip phase noise characterization of digitally controlled swept laser source." Proceedings of SPIE - The International Society for Optical Engineering 10598, (2018). doi: 10.1117/12.2295858.