Real-time in-chip phase noise characterization of digitally controlled swept laser source

Document Type

Conference Proceeding

Date of Original Version

1-1-2018

Abstract

Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.

Publication Title, e.g., Journal

Proceedings of SPIE - The International Society for Optical Engineering

Volume

10598

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