"Refractive Index and Material Dispersion Interpolation of Doped Silica" by Harish R. Sunak and Steven P. Bastien
 

Refractive Index and Material Dispersion Interpolation of Doped Silica in the 0.6-1.8 µm Wavelength Region

Document Type

Article

Date of Original Version

1-1-1989

Abstract

In this paper, we propose an extension of the Claussius- Mossotti interpolation scheme, so that the refractive index and material dispersion of GeO2 and F-doped silica glasses, with doping concentrations different than that of published data, can be predicted in the 0.6-1.8 µm wavelength region. The new interpolation expression provides a well-behaved functional relationship for use in computer models which analyze propagation in single-mode fibers. The technique proposed is particularly powerful because it can be applied to any glass, whether single or multicomponent, having any other single dopant. © 1989 IEEE

Publication Title, e.g., Journal

IEEE Photonics Technology Letters

Volume

1

Issue

6

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