On-chip short-time interval measurement for high-speed signal timing characterization
Document Type
Conference Proceeding
Date of Original Version
1-1-2003
Abstract
We present in this paper an on-chip approach to obtain timing characterization for the ever faster high-speed communication systems. In the proposed short time interval measurement circuit, we use a time-to-digital converter, which consists of a charge pump, a comparator with hysteresis, a 6-bit digital counter, and a capacitor. During the measurement, we control a current source and a current sink to charge or discharge a common capacitor, and record the time length ratio of the charging and discharging process. Using this method, we can easily calculate most of the time-domain parameters. Because the measurement process is independent of the absolute value of the capacitor and current amplitude, this method minimizes the impact of the process variations.
Publication Title, e.g., Journal
Proceedings of the Asian Test Symposium
Volume
2003-January
Citation/Publisher Attribution
Xia, Tian, and Jien Chung Lo. "On-chip short-time interval measurement for high-speed signal timing characterization." Proceedings of the Asian Test Symposium 2003-January, (2003): 326-331. doi: 10.1109/ATS.2003.1250831.