Refractive index and material dispersion interpolation of doped silica in the 0.6-1.8 μm wavelength region
Document Type
Conference Proceeding
Date of Original Version
2-5-1990
Abstract
In this paper, we propose an extension of the Clausius-Mossotti interpolation scheme, so that the refractive index and material dispersion of Ge02 and F doped silica glasses, with doping concentrations different than that of published data, can be predicted in the 0.6 μm to 1.8 pm wavelength region. The new interpolation expression provides a well-behaved functional relationship for use in computer models which analize propagation in single-mode fibers. The technique proposed is particularly powerful because it can be applied to any glass, whether single or multicomponent, having any other single dopant.
Publication Title, e.g., Journal
Proceedings of SPIE - The International Society for Optical Engineering
Volume
1176
Citation/Publisher Attribution
Sunak, Harish R., and Steven P. Bastien. "Refractive index and material dispersion interpolation of doped silica in the 0.6-1.8 μm wavelength region." Proceedings of SPIE - The International Society for Optical Engineering 1176, (1990): 184-188. doi: 10.1117/12.963307.