Title

On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers

Document Type

Article

Date of Original Version

1-1-1990

Abstract

In the area of self-checking circuit designs, it is known that no combinational totally self-checking (TSC) checker has been designed for the 1-out-of-3 code. In this correspondence, we present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker that is TSC (satisfying the conventional TSC definition) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a suffficient level of safety for some implementations. © 1990 IEEE

Publication Title

IEEE Transactions on Computers

Volume

39

Issue

3

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