An SFS Berger Check Prediction ALU and Its Application to Self-Checking Processor Designs
Date of Original Version
A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is presented in this paper. The fault and error models of a large class of VLSI ALU designs are discussed. The proposed design is proved to be fault-secure and self-testing with respect to any single fault in the ALU part. Then, the proposed BCP ALU is proved to be SFS with any design of BCP circuit. Consequently, a self-checking processor whose data path is encoded entirely in a Berger code can be achieved. An efficient self-checking processor can then be designed. © 1992 IEEE
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Lo, Jien Chung, Suchai Thanawastien, T. R. Rao, and Michael Nicolaidis. "An SFS Berger Check Prediction ALU and Its Application to Self-Checking Processor Designs." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 11, 4 (1992): 525-540. doi:10.1109/43.125100.