Novel area-time efficient static CMOS totally self-checking comparator

Document Type

Article

Date of Original Version

2-1-1993

Abstract

The comparator is an essential element in concurrent error detection (CED). To ensure the correctness of error detection processes, comparators must be totally self-checking (TSC): any single fault occurring in the comparator must be detected by at least one normal input pattern, and before the detection of that fault, no erroneous output must be guaranteed. In this paper, an area-time efficient static CMOS TSC comparator design is presented. This comparator uses only eight transistors and is totally self-checking with respect to stuck-at faults, stuck-open, stuck-on, briding faults, and breaks.

Publication Title, e.g., Journal

IEEE Journal of Solid-State Circuits

Volume

28

Issue

2

This document is currently not available here.

Share

COinS