On-chip short-time interval measurement system for high-speed signal timing characterization
Date of Original Version
In this paper, we present an on-chip short-time interval measurement circuit to characterize the ever-faster communication systems. The proposed circuit consists of time parameters extraction subcircuit and measurement subcircuit, which contain a charge pump, a comparator with hysteresis, a digital counter, and a capacitor. During the measurement, we control a current source and a current sink to charge or discharge a common capacitor, and record the time length ratio of the charging and discharging process. Using this method, we can easily measure most of the time-domain parameters. Also this method minimizes the impacts of the process variations to get high measurement accuracy. © 2004 Elsevier B.V. All rights reserved.
Journal of Systems Architecture
Xia, Tian, and Jien Chung Lo. "On-chip short-time interval measurement system for high-speed signal timing characterization." Journal of Systems Architecture 51, 4 (2005): 265-276. doi:10.1016/j.sysarc.2004.11.004.