Title

Equivalent IDDQ tests for systems with regulated power supply

Document Type

Conference Proceeding

Date of Original Version

12-1-2006

Abstract

This paper presents an equivalent current sensing technique for the applications of IDDQ tests. This is accomplished by monitoring the operations of existing on-chip voltage regulators, which indirectly provides the IDDQ information. Equivalent IDDQ information is obtained by measuring an internal voltage signal of a regulator. Then, the measured data is shifted out using the IEEE 1149.1 standard. IDDQ based test methods are used to post-process those data for screening defective circuits. Experiments were successfully conducted assuming the TSMC 0.18μm CMOS technology. © 2006 IEEE.

Publication Title

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

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