Title

Concurrent error detection IC in 2-μm static CMOS logic

Document Type

Article

Date of Original Version

5-1-1994

Abstract

When a comprehensive fault model is considered, static CMOS VLSI has long been prohibited from realizing concurrent error detecting (CED) circuits due to the unique analog faults (bridging and stuck-on faults). In this paper, we present the design, fabrication and testing of an experimental chip containing the integration of a totally self-checking (TSC) Berger code checker and a strongly code disjoint (SCD) built-in current sensor (BICS). This chip was fabricated by MOSIS using 2 μm p-well CMOS technology. In chip tests, all implanted faults, including analog faults, were detected as expected. We also show that the self-exercising mechanism of the SCD BICS is indeed functioning properly. This is the first demonstration of working static CMOS CED chip.

Publication Title

IEEE Journal of Solid-State Circuits

Volume

29

Issue

5

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