Date of Original Version
Jarrett, Jeffrey E. Review of Regression; Models, Methods and Applications by Ludwig Fahrmeir, Thomas Kneib, Stefan Lang and Brian Marx. Technometrics, vol. 56, no. 3, pp. 407. doi: 10.1080/00401706.2014.931751
Available at: https://doi.org/10.1080/00401706.2014.931751
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